The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1996
Filed:
Mar. 23, 1994
Peter Haberlein, Reutlingen, DE;
Hans Link, Reutlingen, DE;
Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG, Reutlingen, DE;
Abstract
A method and apparatus for testing an elongate product for faults and defects, which comprises a rotatable testing head which permits the elongate product to be passed coaxially therethrough and which mounts a pair of testing probes so as to permit adjustment of their operating diameter. In order to automatically adjust the positions of the probes to accommodate elongate products of different sizes, there is provided an external adjustment unit, which stops the testing head in a predetermined angular position. The adjustment unit contains an external adjustment drive and when the rotation of the testing head has stopped, the external adjustment drive is advanced into operative engagement with the adjustable mounting of the testing probes. A measuring pin is also advanced into contact with the mounting of the testing probes so as to monitor the exact position of the probes, and during the repositioning of the probes a signal from the measuring pin is fed back to a control device to assure the precise positioning of the probes.