The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 1996
Filed:
Jul. 01, 1994
Applicant:
Inventors:
Patrick J Howard, Cincinnati, OH (US);
Richard Y Chiao, Clifton Park, NY (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73602 ; 73620 ; 364508 ; 364507 ; 367104 ;
Abstract
A method for detecting and characterizing flaws in an object having an arbitrary-shaped geometry. The present invention uses a synthetic aperture focusing technique (SAFT) which enables maximum aperture imaging. Maximum aperture imaging is attained by determining whether a plurality of reconstruction points within an object are in the width of a transmitted ultrasonic sound wave.