The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 1996
Filed:
Jul. 08, 1994
Keith L Petry, North Reading, MA (US);
Thomas S Hirsch, Bedford, MA (US);
James W Keeley, Nashua, NH (US);
Bull HN Information Systems Inc., Billerica, MA (US);
Abstract
A processing unit couples to a system bus and includes a microprocessor which tightly couples to a local memory. The processing unit also includes an addressable electrically erasable programmable read only memory (EEPROM) unit which couples to the microprocessor and to the system bus. The EEPROM unit stores in first and second separate regions, on-board diagnostic (OBD) routines and boot routines, respectively. The OBD routines are organized into a plurality of categories or phases. The processing unit includes a register accessible only by the microprocessor which, under the control of the OBD routines, is loaded with a number of predetermined values at the beginning of each individual OBD routine for identifying a particular phase and subphase of testing to be performed. Means coupled to the register is directly connected to display a first phase portion of the contents of the register for indicating during which phase of testing a failure occurred. The phase and subphase contents of the register are used to identify the actual test which failed. This information provides an index into a test dictionary which indicates the specific component or group of components which failed.