The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1996

Filed:

Oct. 13, 1994
Applicant:
Inventors:

Masahiro Kayama, Hitachi, JP;

Yasuo Morooka, Hitachi, JP;

Yoichi Sugita, Hitachi, JP;

Masaaki Nakajima, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 251 ; 371 28 ; 39518306 ;
Abstract

A failure diagnosis apparatus for a control system at which plural sensors are provided, comprises a means for extracting correlations among output signals from the predetermined groups of the sensors based on the output signals in the normal operations of the control system by such a means as a quantization method of quantizing a signal space, a means for making up an abnormal degree of the output signals from each predetermined group of the sensors by comparing output signals to be examined from each predetermined group of the sensors and the correlation corresponding to the group of the sensors, and a means for estimating the reliability of each sensor by using the abnormal degrees and for identifying the sensor outputting an abnormal signal.


Find Patent Forward Citations

Loading…