The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 1996
Filed:
Jul. 26, 1994
Nobuhiro Morita, Yokohama, JP;
Takeshi Tada, Isehara, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
In a method and an apparatus for measuring eccentricity of an aspherical lens, a detected lens as the aspherical lens is supported by a holding device and is rotated by a driving device around a rotating axis approximately conforming to an optical axis of the detected lens. Light is irradiated from a light source to the detected lens through a beam splitter and an optical system. Light reflected on the detected lens is reversely transmitted through the optical system and is focused and formed as a spot image. A pressing face of an alignment adjusting device is arranged in a position separated from the optical axis by a radius of the detected lens. The pressing face pushes an outer circumferential edge of the detected lens deflected outward by rotating the detected lens. Thus, the pressing face moves the detected lens and coarsely adjusts a position of the detected lens by approximately conforming the optical and rotating axes to each other. Thus, the spot image of the reflected light can be formed on an image forming face. Another method and another apparatus for measuring eccentricity of an aspherical lens are also shown.