The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1996

Filed:

Dec. 07, 1994
Applicant:
Inventors:

Takao Watanabe, Tokyo, JP;

Mutsuo Hayashi, Tokyo, JP;

Kazunari Matsumoto, Tokyo, JP;

Chikara Tsuchiya, Kawasaki, JP;

Takashi Matsui, Kawasaki, JP;

Masaru Matsubayashi, Tokyo, JP;

Assignees:

Kabushiki Kaisha Meidensha, Tokyo, JP;

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B / ; H03B / ; H03B / ; H03L / ;
U.S. Cl.
CPC ...
331176 ; 331 / ; 3311 / ; 331158 ; 331173 ; 3311 / ;
Abstract

A digital control system such as a digital temperature compensated crystal oscillator (DTCXO) system is arranged to offer superior oscillating performance with reduced size and cost. For example, to reduce the memory capacity, a memory 31 receives upper 6 bits of temperature data, and a decoder 32 calculates temperature compensation data from lower 4 bits and output data from the memory (FIGS. 1-11). For a one-chip configuration and low power consumption, a MOS type Colpitts oscillator (FIG. 16) is provided with a circuit for adjusting the source resistance of the MOS. For size reduction and fine frequency adjustment, a DTCXO is provided with sections such as an adder 341, an up-down counter 342 and an auxiliary frequency control section (AFC) 332 (FIGS. 20, 21, 24 and 25). An adding section 415 is provided between a D/A converting section 414 and a capacitance varying section 416 to obtain superior linearity with respect to a control voltage and quality of offset.


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