The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 20, 1996
Filed:
Apr. 11, 1995
Indranath Dutta, Marina, CA (US);
David P Lascurain, North Charleston, SC (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A Constant-Depth Scratch Test (CDST) technique to quantitatively determine he shear strength of interfaces between thin metallic or non-metallic films and metal or ceramic substrates is revealed. The test overcomes two problems associated with other types of scratch tests, namely the instrumental complexity required for real-time detection of interfacial failure, and the inability to quantify interfacial strength. These problems are circumvented by maintaining a constant depth during scratching through the coating and the substrate, monitoring the horizontal and vertical forces to sustain the constant depth scratch, and finally by using a model to analyze the test results to quantify the interfacial shear strength. Unlike other scratch tests, this test is capable of measuring interfacial shear strength as a function of position on the film-substrate sample.