The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 1996

Filed:

May. 03, 1994
Applicant:
Inventors:

David J Balke, Chicago, IL (US);

Jacques E Hoffmann, Chicago, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ; G01M / ;
U.S. Cl.
CPC ...
73 40 ; 73 492 ;
Abstract

A leakage detection system and method for measuring pressure leaks from pressure vessels, containers, or the like which hold or exclude fluids. A sealed test fixture or bell jar surrounds the container or part under test and is connected to a reference pressurized reservoir. A reference bias flow is introduced into the bell jar to establish a 'floor' or offset wherein any deviation measured from introduced bias flow indicates an anomaly. The test part is pressurized. The flow between the bell jar and the reference pressurized reservoir is measured by a mass flow leak sensor. The measured flow is used to determine the leakage of the test part by taking into account the previously introduced reference bias flow. The present invention provides accurate measurement of leaks having low flow rates occurring over short periods of time.


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