The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1996
Filed:
May. 27, 1994
Thomas E Lynch, Brighton, MA (US);
Vladimir Sejnoha, Cambridge, MA (US);
Thomas E Dinger, Waltham, MA (US);
Kurzweil Applied Intelligence, Inc., Waltham, MA (US);
Abstract
An input utterance is converted to a sequence of standard or prototype data frames which are compared with word models which are represented by respective sequences of standard or prototype probability states, there being a pre-calculable distance metric representing the degree of match between each prototype data frame and each prototype model state. Only distance measurements better than a calculated threshold are considered meaningful and those meaningful metrics are stored in a packed list. Also stored is an address array of offsets for locating particular meaningful metrics in the list, the address array being accessed by the corresponding frame and state indices. Also stored is an array for distinguishing meaningful and non-meaningful metrics. Accordingly, an input utterance can be evaluated by locating meaningful metrics in the packed list using the address array and by utilizing a default value for any non-meaningful metric.