The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 1996
Filed:
Oct. 03, 1994
Applicant:
Inventor:
Katsuhiko Kobayashi, Tokyo, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351237 ; 351239 ; 351246 ;
Abstract
A method and apparatus of optometry, which lets a subject observe an optometrical target through a correcting optical system having a variable refractive power, are designed to measure the optical characteristics of the subject with a measuring means, and display on a display means a target image as the case of the observation of a prescribed target by the subject, based on the measured optical characteristics of the subject.