The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 1996

Filed:

Oct. 25, 1994
Applicant:
Inventor:

Manuel Martin Neira, VN Voorhout, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342120 ;
Abstract

An altimetry method uses one or more sources of opportunity, for example transmitters on satellites of the 'GPS' satellite navigation system. One or more receivers on board an aircraft or a satellite in low Earth orbit are used. Multiple correlation is applied between the direct signal received from the transmitter and the reflected signal. The coordinates of the point of specular reflection are derived from the measured delay achieved by said multiple correlation and comparison with a theoretical model of the terrestrial sphere. The device for implementing the method includes a signal processor, a variable delay circuit, a discrete delay line, a bank of correlators and detectors. A specific application of the method and device is ocean altimetry.


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