The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1996
Filed:
Oct. 04, 1994
Applicant:
Inventors:
Ira R Forman, Austin, TX (US);
Hari H Madduri, Austin, TX (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39518307 ; 395650 ;
Abstract
In a distributed data processing system or network testing a distributed processing program is achieved by a test manager and a test scenario. Functionally, the test manager reads the test scenario to identify processes of the system to be tested. The identified processes then read relevant portions of the test scenario and executes such portions. While the processes are executing the scenario portions, the test manager monitors resulting data from each process. If the resulting data does not match an expected data value, the test manager flags an error regarding the process that produced the errant data.