The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1996
Filed:
Aug. 11, 1994
Andrew Green, Harrow, GB;
Eastman Kodak Company, Rochester, NY (US);
Abstract
Sensitometers are used for monitoring photographic and radiographic processes, and then making it possible to control these processes. However, although it is relatively straightforward to obtain control strips for individual sensitometers, it is often difficult to compare the results of control strips which have been exposed using different sensitometers. Described herein is a method for calibrating or cross-referencing sensitometers. The method comprises exposing a first control strip to a step wedge in the first sensitometer, and a second control strip-to a step wedge in the second sensitometer, the first and second control strips being formed on the same photographic material. The material is then processed and the characteristics of the material is determined using the known exposures given to the material by the second sensitometer and the density values obtained corresponding to those exposures. Once these characteristics are known, it is then possible to calculate the exposure given at each-step on the first control strip using the following equation: