The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1996
Filed:
Apr. 05, 1994
Bradley B Bushard, Chaska, MN (US);
Philip G Dion, Columbia Heights, MN (US);
Joseph V Heinz, Eden Prairie, MN (US);
BellSouth Corporation, Atlanta, GA (US);
Abstract
An automated functional test system for PC circuit boards. The test system includes a test chamber for removably receiving circuit boards to be tested, heating and cooling systems for controlling the temperature in the test chamber, a display, a variable circuit board power supply and diagnostics memory for storing PC circuit board diagnostic software. A control system is coupled to the heating and cooling systems, display, power supply and diagnostics memory. The control system causes the circuit board to execute the diagnostic software during low temperature, high temperature and cycling temperature diagnostic phases. The diagnostic phases are sequentially and repeatedly performed during a test cycle. The cooling system is actuated during the low temperature diagnostic phases to cool the test chamber to ambient temperature. The heating system is actuated during the high temperature diagnostic phases to heat the test chamber. Both the heating and cooling systems are actuated during the cycling temperature diagnostic phases to cycle the temperature. The power supplied to the circuit board is varied during the diagnostic phases. If the circuit board fails to properly execute the diagnostic software during the diagnostic phases, the display is actuated to provide an indication of a functional test failure. The display is actuated to provide an indication of a functional test completion at the end of the test cycle if the circuit board successfully executes the diagnostic software during the diagnostic phases.