The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1996

Filed:

Mar. 09, 1994
Applicant:
Inventors:

Brenda C Nke-Aka, Winchendon, MA (US);

Richard Delaney, Lunenburg, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C08L / ; C08L / ;
U.S. Cl.
CPC ...
525 74 ; 525 78 ; 525 79 ; 525 80 ; 525 83 ; 525 84 ; 525 86 ;
Abstract

High impact polystyrene (HIPS) and other impact modified styrenic polymers such as ABS and MBS tend to suffer from environmental stress cracking. On extended exposure to oily or fatty substances the plastic tends to craze, then crack and finally break. Unfortunately, a number of applications for impact modified polymers is in areas where there is a high potential to contact with oily or fatty substances. The environmental stress crack resistance (ESCR) of impact modified styrenic polymers may be increased by increasing the particle size of the impact modifier and including a low molecular weight polybutene.


Find Patent Forward Citations

Nke-Aka, Brenda. (1996). Environmental stress crack resistance of hips (U.S. Patent No. 5543461). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5543461

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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