The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1996

Filed:

Sep. 27, 1994
Applicant:
Inventors:

Hideki Koike, Chikuzenda-machi, JP;

Kenji Takeda, Kyoto, JP;

Assignee:

Horiba, Ltd., , JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 83 ; 422 94 ; 422 95 ; 422 96 ; 422 97 ; 436137 ; 73 2321 ; 73 2331 ;
Abstract

For an exhaust analyzer, the factors causing turbulence and mixing of the sample gas are removed from the sample gas-introducing pipe in order to introduce the sample gas into the analyzer cell under laminar conditions. Further, the indicated changes resulting from the fluctuations of sample gas pressure within the analysis cell of such a construction are compensated. As a result, the sample gas can be quantitatively analyzed with a high rate of response under the condition that the influences caused by the fluctuations of the sample gas pressure are reduced. The sample gas is introduced into the cell-type gas analyzer from the sample gas source through a gas-introducing pipe under laminar conditions. A pressure sensor detects the changes in pressure within the cell of the gas analyzer, and in response to the pressure sensed by the pressure sensor a compensating means compensates for the erroneous indication of gas characteristics generated by the analysis cell as a result of the fluctuations of sample gas pressure therein.


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