The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 1996

Filed:

Jun. 14, 1994
Applicant:
Inventors:

Weinfried Beisel, Wilnsdorf, DE;

Hans-Michael Schwarz, D-76307 Karlsbad, DE;

Bodo Morgenstern, D-35041 Marburg-Wehrshausen, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D / ;
U.S. Cl.
CPC ...
194335 ; 453-4 ;
Abstract

A testing apparatus is provided for round discs, for example coins, in which the discs move along a supporting guide past at least one gauge. The round discs are fed onto an inclined chute surface from which they slide down and onto a collecting track, of which there is at least one, that is inclined with respect to the horizontal and that collects the discs and guides them away along a supporting guide. Thereafter, the discs are sent to an optoelectronic device for measurement of their diameters and/or thicknesses. This apparatus makes possible throughputs that are significantly higher than those of the previously known testing apparatuses.


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