The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 1996
Filed:
Feb. 07, 1992
Tatsuya Murakami, Tachikawa, JP;
Masaaki Fujinawa, Tokyo, JP;
Hiromichi Fujisawa, Tokorozawa, JP;
Hidefumi Masuzaki, Odawara, JP;
Yasuo Kurosu, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An image processing system wherein for an inputted composite image composed of a line image and a dither image, both a line image processing and a dither image processing are carried out in parallel, and one of the processed results as selected in accordance with the image region discrimination result. The dither image processing is carried out through data conversion for calculating multivalued gray scale image from the inputted image data, gray scale data conversion for adjusting the gray scale image data so as to match an output device and obtaining such adjusted gray scale image data, and re-binarization for re-binarizing the gray scale image data after subjected to the gray scale conversion. The image region discrimination for discriminating if an image region is of a line image of a dither image is carried out based on a ratio of the number of black or white pixels within the region to the contour line length within the range. In ordered dither image through a screened type dither matrix is discriminated in accordance with a correlation between adjacent pixel trains each having a predetermined number of pixels.