The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 1996

Filed:

Aug. 03, 1994
Applicant:
Inventors:

Samir S Palnitkar, Sunnyvale, CA (US);

Prasad V Saggurti, Sunnyvale, CA (US);

Ser-Hou Kuang, San Jose, CA (US);

Chee-Keng Chang, Mountain View, CA (US);

Guillermo Maturana, Berkeley, CA (US);

Assignee:

Sun Microsystem, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364578 ;
Abstract

A computer system for generating a summary of test coverage for a hardware description. The hardware description corresponds to a finite state machine (FSM). This embodiment requires at least one test vector. The computer system comprises a memory and a processor. The memory is for storing the hardware description and the test vector. The processor, coupled to the memory, uses the hardware description and generates state information corresponding to the FSM. The processor, using the state information, further generates a first description. The first description includes a description for monitoring states and signals in the hardware description. The processor, using the test vector, the hardware description and the first description, further generates the test coverage summary.


Find Patent Forward Citations

Loading…