The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 1996
Filed:
Oct. 11, 1994
Applicant:
Inventors:
Balkrishna S Annigeri, Manchester, CT (US);
Leroy H Favrow, Newington, CT (US);
Robert J Haas, Coventry, CT (US);
Michael Winter, New Haven, CT (US);
Ronald I Holland, Jr, East Hampton, CT (US);
Jason S Wegge, Springfield, MA (US);
David M Sanford, Colchester, CT (US);
Assignee:
United Technologies Corporation, Hartford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364507 ; 364525 ; 364579 ; 364580 ; 73788 ; 73799 ; 73800 ; 73805 ; 356 23 ; 356237 ; 382141 ; 382149 ;
Abstract
An apparatus for monitoring the growth of surface cracks in materials includes a means for applying a load to a specimen to simulate actual use of the specimen, means for illuminating the specimen, means for capturing images of the specimen, and means for processing the images to monitor crack growth in the specimen. Optionally, the means for processing can be used to control the other means.