The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 1996
Filed:
Aug. 07, 1995
Applicant:
Inventors:
Peter J Basser, Washington, DC (US);
James H Mattiello, Falls Church, VA (US);
Denis LeBihan, Rockville, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324307 ; 324309 ;
Abstract
A method and system for measuring the effective diffusion tensor for spin labeled particles, and generating images therefrom. The effective diffusion tensor is related to the echo intensity in an NMR spin-echo experiment. This relationship is used to design experiments from which the diffusion tensor components are estimated. Estimation of Deff provides the theoretical basis for a new MRI modality, diffusion tensor imaging. Diffusion ellipsoids may be used for generating images representative of physical characteristics of the observed object. Scalar invariants of the diffusion tensor are also used for imaging.