The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 1996

Filed:

Jun. 09, 1994
Applicant:
Inventors:

Yasushi Kaneda, Tokyo, JP;

Koh Ishizuka, Ohmiya, JP;

Satoshi Ishii, Tokyo, JP;

Kenji Hisamoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356356 ; 2502 / ; 25023114 ;
Abstract

A rotation detecting apparatus includes a grating portion provided on one of two objects for which relative rotation is to be detected, a light-emitting portion provided on the other of the two objects, and a light-receiving portion provided on the other object. The grating portion has at least one multi-helix diffraction grating. The light-receiving portion receives a beam emitted from the light-emitting portion and then traveling by way of the multi-helix diffraction grating. Information of relative rotation of the two objects is detected through light reception of the light-receiving portion.


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