The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 1996

Filed:

Dec. 18, 1991
Applicant:
Inventors:

Albert R Bertram, Eindhoven, NL;

Johannes W Coenders, Eindhoven, NL;

Francis J Span, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ;
Abstract

An interferometer which may be used in a Fourier transform infra red spectrometer comprises a beam splitter (10), first and second fixed mirrors (18,26), path length variation means (20), and a folding mirror (16). The optical components are mounted on a casting (8) such that the beam splitter (10) and folding mirror (16) are arranged parallel to each other and the fixed mirrors (18,26) are attached to a single face of the casting in the same plane. The path length variation means (20) comprises two parallel opposed mirrors (22,24) which are rotatable to vary the length of the optical path between the beam splitter (10) and the fixed mirror (26).


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