The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1996
Filed:
Oct. 31, 1994
Takanori Akiyoshi, Kawasaki, JP;
Tadashi Mochizuki, Kawasaki, JP;
Akiko Sakashita, Kawasaki, JP;
Yohichi Ishibashi, Kawasaki, JP;
Satoshi Kinoshiro, Kawasaki, JP;
Yoshihito Iwata, Kawasaki, JP;
Yoshihiko Kawai, Kawasaki, JP;
Yoichi Nimura, Kawasaki, JP;
Hiroaki Miyahara, Kawasaki, JP;
NKK Corporation, Tokyo, JP;
Abstract
A method for analyzing steel which comprises: grinding an analysis area of a steel ingot; sealing the analysis area with a sealing section of a cell for generating fine particles; again grinding the analysis area, while an argon gas is introduced into the cell; irradiating a pulsed laser beam of 10.sup.8 W/cm.sup.2 or more onto the analysis area at an irradiating spot of at least 1 mm.sup.2 to generate the fine particles; moving the irradiating spot; and transferring the generated fine particles by the argon gas to a plasma emission analysis for analysis. A further method for analyzing steel comprises: solidifying a molten steel sample, forming a red-hot sample; putting the sample into a sample holding section of a sample chamber under a purified argon gas atmosphere, the sample holding section having an inner curved surface the same as a curved surface of the sample; irradiating a pulsed laser onto the sample to remove a sample surface layer of 25 .mu.m or more of the sample and to generate fine particles from the sample; and exciting the fine particles by a plasma emission analyzer to analyze the composition of the fine particles.