The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1996
Filed:
Dec. 06, 1994
Joseph V Miseli, San Bruno, CA (US);
Sun Microsystems, Inc., Mountain View, CA (US);
Abstract
A system and method for testing and evaluating a display device and its associated display drive circuitry through computer generated graphic test patterns which are dynamically alterable. The system comprises a display device for displaying the test patterns, a computer for generating the test patterns which typically are dynamically alterable and a communication line for coupling the computer and the display device together so that the computer can transmit information forming the test patterns to the display device. The test patterns are monitored visually to detect video artifacts. Alternatively, monitoring may be performed by measuring devices such as signal analyzing devices or optical testing devices. The method for evaluating and detecting video artifacts of a display device and its associated display drive circuitry is performed through at least three steps. First, a test program is executed by the processor to produce a plurality of video signals collectively forming a specific test pattern which are transferred into the display device through the display drive circuitry. Second, an input device is re-mapped to that it can provide information for dynamically altering the specific test pattern. Finally, evaluation of the display device and the display drive circuitry is performed based on visual evaluation, optical evaluation by an optical testing device or signal evaluation by an signal testing device.