The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1996
Filed:
Feb. 14, 1995
Seigo Ando, Tokyo, JP;
NKK Corporation, Tokyo, JP;
Abstract
A current of predetermined frequency is fed to a coil wound around a ferromagnetic core through a fixed impedance means. A magnetic flux measurement is performed in terms of a level of a DC component of a voltage generated across the coil. A DC bias is added to the current of predetermined frequency, and the resultant current is applied through the fixed impedance means to the coil wound around the ferromagnetic core. A magnetic flux measurement is performed in terms of a level of a DC component of the voltage across the coil. A magnetic flux measuring method and apparatus for embodying the same have a high sensitivity in detecting a minute magnetic flux and an improved temperature characteristic because an output voltage little varies against a temperature variation. A magnetic flux measuring method and apparatus for embodying the same, when they are applied to a leakage flux flaw detection using a saturable magnetic flux sensor, is capable of expanding a measuring span of the magnetic flux sensor, thereby to improve a flaw detection performance.