The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 1996
Filed:
Jul. 27, 1994
Christian Niesporek, Wiesloch, DE;
Hans Heid, Bammental, DE;
Microm Laborgerate GmbH, Waldorf, DE;
Abstract
A microtome (2) with a sample holder (51) for a sample (22) to be thinly sectioned and with a knife holder (12) for a cutting knife (10) is described, wherein the sample holder (51), for performing a cutting movement (arrow 54) relative to the knife holder (12), can be driven in a first spatial direction (arrows 54, 56) by means of a first drive device (53), and for performing a coarse adjustment and a section thickness adjusting movement in a second spatial direction (arrow 24) perpendicular to the first spatial direction (54, 56) by means of an electrical second drive device (50). In the vicinity of the cutting knife (10), for defined delimitation of the coarse adjustment movement of the sample holder (51) in the second spatial direction, a delimiting device (20) is provided, which is connected over control means (44), preferably an electronic control, with the electrical second drive device (50).