The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 1996

Filed:

Mar. 21, 1995
Applicant:
Inventors:

Yoshihiro Inada, Itami, JP;

Shinji Yamashita, Itami, JP;

Miki Nishimoto, Itami, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H / ;
U.S. Cl.
CPC ...
327234 ; 327 91 ; 327158 ; 327271 ;
Abstract

A sampling circuit is not susceptible to an influence of structural components and environmental changes. A phase difference detecting circuit (5) detects a deviation of a sampling clock (.phi.2) from optimal sampling timing and outputs a phase difference signal. On the other hand, a phase reference signal (ORG) which is used as a reference to determine a phase advance and a phase lag is generated by a phase reference detecting circuit (4). In accordance with these signals, a sampling clock shifting circuit (2) shifts the sampling clock (.phi.2) so that the sampling clock (.phi.2) is activated at optimal sampling timing. Sampling is performed in accordance with such a sampling clock (.phi.2), whereby a basic signal is generated from which the phase reference signal (ORG) and the phase difference signal (i.e., an equivalent signal (EQU) and a non-equivalent signal (UPDN)) are generated. By means of feedback control, the sampling clock is automatically activated at optimal sampling timing.


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