The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 1996
Filed:
Jun. 23, 1994
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G05F / ;
U.S. Cl.
CPC ...
324105 ; 73766 ; 36457103 ;
Abstract
A method for compensating an offset voltage temperature drift in a semiconductor strain gage sensor in which a temperature-sensitive power supply is modeled as the one for providing the output voltage V.sub.0 =KV.sub.S (1+.alpha.T), and, under the condition that the resistance of the compensating resistor and the coefficient .alpha. are within practical ranges, respectively, the parameter K is determined so as to minimize the compensating error, thereby both of the primary order term and the secondary order term with respect to the temperature in the offset voltage of the strain gage can be compensated so that the offset temperature drift can be reduced.