The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 1996

Filed:

Aug. 23, 1994
Applicant:
Inventor:

Robert P Callaghan, Jr, Westerly, RI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01M / ;
U.S. Cl.
CPC ...
33502 ; 33784 ; 33811 ; 73 / ;
Abstract

A linear test gage for testing the accuracy of machine tools is operable for out of roundness measurements as well as long-range linear measurements. The test gage consists of a linear guide assembly, first and second reference elements, and a long-range linear measurement device. The linear guide assembly includes an elongated guide profile, a guide rail secured to the guide profile, and a slide which is slidably movable relative to the guide rail. The first reference element is attached to the first end of the guide profile and the second reference element is attached to the slide so that the reference elements are relatively movable over a length of about 30-40 inches. A first knuckle assembly secures the first reference element in a fixed position relative to the machine tool. A second knuckle assembly secures the second reference element to an active element of the machine tool. During testing, the active machine element is programmed to move the second reference element along a predetermined trajectory wherein the linear guide assembly permits co-linear movement of the reference elements as the active element moves the second reference. The long-range linear measuring device measures the distance between the reference elements as the second reference element is moved. The long range measurement capability allows use of the device in both circular and linear measurements. The test gage further includes a counter weight assembly and an anti-rotation device.


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