The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 1996

Filed:

Sep. 30, 1993
Applicant:
Inventors:

John Y Sayah, Fishkill, NY (US);

Robert A Rozwod, Hopewell Junction, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382240 ; 382243 ; 364491 ;
Abstract

A method for restructuring information stored in physical design image form, such as an image of a layer in a semiconductor package, into a hierarchical area specification model useful in automated design applications. The restructuring results in recognizing identical patterns in the image and storing common information about the patterns in a single location to decrease storage space required and improve access efficiency by design application programs needing the information. Parameters controlling the method can be adjusted to produce a hierarchical model that is particularly suited to the needs of a particular application program.


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