The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Sep. 12, 1994
H Galen Parker, Rochester, NY (US);
Douglas S Finnicum, Webster, NY (US);
Richard D Young, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
An image processor based system and method are provided for recognizing predefined-types of coating density imperfections in a web. Specific imperfection-types to be analyzed include continuous-type, as well as point-type, anomalies. Continuous-type imperfections are recognized in a moving continuous web through the accumulation and integration of density data on the web passing through a system imaging area. Depending upon the type of imperfection to be imaged, the light source provides either constant illumination or strobed illumination of the moving coated web. For most types of imperfections, transmissive illumination of the web is used, however, for point-type anomalies reflective illumination is possible, particularly if the web is static. A machine vision image processor contains predefined lookup tables which allow adaptive control of web illumination within the imaging area. An integrating sphere is used to provide for uniform web illumination. Corresponding machine vision based imperfection recognition processing routines are also described.