The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Dec. 14, 1994
Ralph W Andrea, Sunnyvale, CA (US);
GTE Government Systems Corporation, Mountain View, CA (US);
Abstract
A method and apparatus for detecting and measuring the code phase offset in bits and fractional bits, or the time delay in master clock cycles, between a reference binary pseudo-noise (PN) code sequence and a similar sequence of unknown delay. Rapid detection and measurement is achieved by utilizing parallel feed-forward logic and eliminating all feedback and variable delay circuitry. At the start of a new detection and measurement cycle, the current state of the A input sequence is stored and correlated with new B input stakes. Likewise the state of the B input sequence is stored and correlated with a new A input code states. After a time equal to the delay between the two input sequences, one of the correlators will produce an output. A time delay counter runs from the start of a new detection and measurement cycle and stops on the occurrence of a correlator output.