The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Mar. 30, 1994
Masanao Fujieda, Toyohashi, JP;
Nobuyuki Yano, Okazaki, JP;
Yoshiaki Mimura, Gamagori, JP;
Naoki Isogai, Nishio, JP;
Nidek Co., Ltd., , JP;
Abstract
An ophthalmic apparatus for use by an examiner in examining an examinee's eye includes an optical system for examining the examinee's eye, an observing optical path for observing the examinee's eye directly in binocular vision, a beam splitter disposed in the observing optical path, and a mark forming device for forming an aiming mark at a position conjugate to a predetermined portion of the anterior part of the eye, the light of the aiming mark being reflected by the light splitting member into the eyes of the examiner, wherein the positional relationship along the observing optical path between the anterior part of the examinee's eye and the aiming mark is perceived through the examiner's eyes and the suitability of the working distance of the apparatus can be judged.