The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Mar. 20, 1995
Tetsuyuki Miwa, Aichi-ken, JP;
Munehiro Nakao, Toyokawa, JP;
Nobuo Suzuki, Aichi-ken, JP;
Koki Kato, Anjo, JP;
Nidek Co., Ltd., Aichi-ken, JP;
Abstract
An ophthalmologic alignment device for aligning a measuring system at a predetermined position for an eye to be examined. The user moves the measuring system with a joystick for aligning purposes while observing a frontal eye image with an observation unit. A second moving unit further moves the measuring system moved by the user. An index projection/detection system projects an index onto the eye and detects the reflected index. The controller causes drivers to drive the second moving unit on the basis of the result of the detection of the index projection/detection system. A mode switch switches the movement of the measuring system from a mode in which the observation unit is moved by the first moving unit to a mode in which the observation unit is moved by the second moving unit, whereby the alignment of the eye and the measuring system is achieved easily and with high accuracy, irrespective of the degree of the user's skillfulness in handling the alignment device.