The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 1996

Filed:

Aug. 29, 1994
Applicant:
Inventor:

Shinichi Nagata, Matsubara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324636 ; 324631 ; 324632 ;
Abstract

A method of measuring the dielectric constant of a sheet-like material is disclosed, the method using a cavity resonator having a transverse slit formed in the intermediate region thereof between the opposite ends for disposing a sample sheet perpendicularly to the direction of the length thereof. The dielectric constant is measured as a function of the difference f.sub.1r -f.sub.r2 between the microwave resonant frequency f.sub.1r of the cavity resonator obtained when the sample is not inserted in the transverse slit and the microwave resonant frequency f.sub.r2 of the cavity resonator obtained when it is inserted in said transverse slit. The resonant frequency f.sub.2r (.beta.) is calculated in the state in which the sample sheet in said transverse slit is rotated through a given angle .beta. with respect to said longitudinal axis from the predetermined angle designated by 0.degree., from the formula approximating the resonance curve in the cavity resonator.


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