The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Oct. 29, 1993
Delmar L Logue, Herrick, IL (US);
Other;
Abstract
An apparatus for detecting surface flaws in cylindrical articles by means of asymmetric magnetic detection, utilizing a rotating magnetic field, said articles having central longitudinal axes, apparatus having a guide assembly for guiding the cylindrical articles along a displacement path having a central longitudinal axis extending coaxially of the central longitudinal axes of the articles and a pair of multiple polar sensor assemblies positioned in annular relationship with the displacement path for producing a plurality of phase/amplitude modulated signals representative of the surface geometry of the inspected cylindrical article, also disclosed are two embodiments of cylindrical container flange imperfection detector apparatus utilizing multiple polar sensor assemblies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile