The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 1996
Filed:
Jun. 08, 1994
Takaji Yamashita, Hamamatsu, JP;
Eiichi Tanaka, Hamamatsu, JP;
Hamamatsu Photonics K.K., Hamamatsu, JP;
Abstract
Two .gamma.-rays accompanying position annihilation are incident into .gamma.-ray detectors in detector arrays set with a measured object inbetween. Electric pulse signals output from the .gamma.-ray detectors are supplied to an annihilation presuming unit, which obtains a presumable event of positron annihilation by the coincidence counting conditions and which notifies an image reconstructing unit of annihilation occurrence notification and information of detectors. Electric pulse signals output from the .gamma.-ray detectors are supplied to a time-of-flight difference measuring unit, which measures a difference of detection time between the detectors and notifies the image reconstructing unit of it. The image reconstructing unit obtains a presumable annihilation position based on the received information and stores it. A tomographic image of a specific portion is obtained by an algorithm for substantially compensating measurement errors, for example by the iterative process with the stored information.