The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 1996

Filed:

Feb. 23, 1995
Applicant:
Inventors:

Arkadiusz Polacin, Erlangen, DE;

Willi Kalender, Moehrendorf, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378 15 ; 378901 ; 36441316 ;
Abstract

A computed tomography method and apparatus conduct a spiral scan of a subject wherein non-uniformities of noise and topical resolution are greatly reduced. A power spectrum S.sub.o for interpolated projections is identified, from which a frequency characteristic H(f,.theta.), of an optimum filter for the projections interpolated from complementary data is determined, with ##EQU1## with .sigma..sub.o.sup.2 being the variance of the quantum noise associated with a projection and w(.theta.) being the spiral weighting.


Find Patent Forward Citations

Polacin, Arkadiusz. (1996). Spiral scan computed tomography apparatus and method for operating same (U.S. Patent No. 5530731). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5530731

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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