The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 1996
Filed:
Jan. 20, 1995
Robert T Gibson, Snohomish, WA (US);
Paul H Heydron, Everett, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
An electronic test instrument adapted for displaying only meaningful information notwithstanding the intermittent arrival of valid input signals due to probing operations is provided. Two independent measurement processes measure the input signal simultaneously. The first measurement process operates in a similar fashion to a digital storage oscilloscope (DSO) by successively sampling the input signal to produce waveform information which are selectively sent to an LCD display device which graphically displays the waveform. The second measurement process continually performs a stability assessment of the input signal by collecting a series of stability measurements of a selected input signal parameter, creating a moving average of the series, and comparing each new stability measurement to the moving average relative to stability criteria. The stability decision controls the flow of waveform information to the display, thereby ensuring that only meaningful information is displayed based on waveform scans conducted when the input signal is stable.