The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 1996
Filed:
May. 30, 1995
Alex Natanzon, Haifa, IL;
Gideon Berlad, Haifa, IL;
Dov Maor, Haifa, IL;
Yigal Shrem, Haifa, IL;
Adrian Soil, Haifa, IL;
Elscint Ltd., Haifa, IL;
Abstract
A system for recording fewer of the events that are caused by unwanted photons with greater stability. The system locally determines the energy spectrum and fits for each pixel of the image the determined energy spectrum with a modified trial function composed of: a photopeak component of known energy shape, Compton scatter components having theoretically derived energy shapes and, when applicable, also measured or calculated energy spectra of other unwanted photons. The modified trial function also takes into consideration unknown local deviations in the outputs of electronic components. The amplitude of the photopeak distribution resulting from the fit is used to obtain the local content of wanted interactions in the image. This enables removal of Compton contamination and also the contamination caused by interaction of the gamma photons with lead components.