The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1996
Filed:
Dec. 23, 1994
Edgar N Lewis, Brookeville, MD (US);
Ira W Levin, Rockville, MD (US);
Patrick J Treado, Pittsburgh, PA (US);
Abstract
Techniques for providing spectroscopic imaging integrates an acousto-optic tunable filter (AOTF), or an interferometer, and a focal plane array detector. In operation, wavelength selectivity is provided by the AOTF or the interferometer. A focal plane array detector is used as the imaging detector in both cases. Operation within the ultraviolet, visible, near-infrared (NIR) spectral regions, and into the infrared spectral region, is achieved. The techniques can be used in absorption spectroscopy and emission spectroscopy. Spectroscopic images with a spectral resolution of a few nanometers and a spatial resolution of about a micron, are collected rapidly using the AOTF. Higher spectral resolution images are recorded at lower speeds using the interferometer. The AOTF technique uses entirely solid-state components and requires no moving parts. Alternatively, the interferometer technique employs either a step-scan interferometer or a continuously modulated interferometer.