The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 1996

Filed:

Jul. 12, 1995
Applicant:
Inventor:

Isamu Takahashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; G02F / ;
U.S. Cl.
CPC ...
324770 ; 324769 ; 345 93 ; 359 57 ;
Abstract

A method of inspecting cells of liquid crystal displays comprising the first step in which the empty TFTs in the active color LCD arrays are energized to charge the auxiliary pixel capacitor corresponding to the individual electrodes, the charged condition is maintained by deenergizing the TFT's, the electric charge is released through the source and drain of the TFTs and the resistor connected to the ground side thereof by re-energizing the TFTs, and the amount of the discharge is measured and the second step in which the same energizing, deenergizing, re-energizing, charging, discharging and measurement as done in the first step are made on the TFTs filled with a liquid crystal in the active color LCD arrays, the difference between the amounts of discharge measured in the first and second steps is integrated or the time constant of the amount of discharge measured in the first step is deducted from the time constant of the amount of discharge measured in the second step.


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