The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1996
Filed:
Jul. 29, 1994
Rao P Gullapalli, Richmond Heights, OH (US);
Joseph V Hajnal, London, GB;
Haiying Liu, Euclid, OH (US);
Larry Kasuboski, Solon, OH (US);
Picker International, Inc., Highland Heights, OH (US);
Abstract
An examination region (34) is divided into a multiplicity of slices, e.g. slices 1-20. The slices are divided up into groups or slabs, e.g., slabs I-V. A series of magnetization inversion pulses (70.sub.I- 70.sub.V) and slab select gradient pulses (74.sub.I -74.sub.V) are applied at regular intervals. At a duration after each slab inversion at which the magnetization of a material such as CSF is at a minimum or null (80) marks a center of a data acquisition period (84). A plurality of imaging sequences (82) are conducted in each data acquisition period. Each of the imaging sequences collects one or more data lines from each of the slices within the corresponding slab. This process is repeated cyclically until all of the data lines of each slice of each slab have been collected. The data lines are reconstructed (102) into an image representation which is stored in an image memory (104) for selective display on a video monitor (108).