The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 1996
Filed:
Jun. 30, 1994
Dennis M Gallagher, Danbury, CT (US);
Thomas M Pfeifer, Bridgeport, CT (US);
Richard P Schoonmaker, Wilton, CT (US);
Pitney Bowes Inc., Stamford, CT (US);
Abstract
In a machine including structure for printing indicia on a sheet, and structure for feeding the sheet in a path of travel to the printing structure, wherein the feeding and printing structure each include a plurality of components, apparatus for accounting for malfunction conditions of the machine, the apparatus comprising, structure for controlling the machine, the controlling structure including a microprocessor, the controlling structure including a random access memory (RAM) and a non-volatile memory (NVM) respectively connected to the microprocessor, the microprocessor programmed for causing a plurality of desired movements of the respective components of the sheet feeding and printing structure and thus of a sheet in the path of travel, a plurality of sensors respectively connected to the microprocessor for sensing actual movements corresponding to the desired movements of the respective components of the sheet feeding and printing structure and of a sheet in the path of travel and providing signals to the microprocessor, the microprocessor programmed for determining whether the differences between corresponding desired and actual movements are acceptable, and the microprocessor programmed for storing data in both the RAM and NVM corresponding to malfunction conditions identifying respective unacceptable differences.