The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 1996
Filed:
Nov. 05, 1993
Stephen Sacks, Melville, NY (US);
Cliff Weber, Center Moriches, NY (US);
Barry E Becker, Smithtown, NY (US);
ILC Data Device Corporation, Bohemia, NY (US);
Abstract
An integrated circuit device for comparing the state of a large number of inputs (i.e. 'discretes') against any one of a plurality of selectable voltage levels. The compared data is examined in a 3.times.3 matrix format. In a redundant mode, comparators are utilized in a triple-redundant configuration to obtain a consensus on input states, at three successive time intervals, raising a flag when consensus fails. Inputs, whether in a redundant or non-redundant mode are distributed along three different sides of a rectangular-shaped substrate to prevent catastrophic mechanical failures. In the redundant mode, discretes are compared using a voting technique such that when all three levels are the same, an error free status is provided, whereas a two-out-of-three vote is interpreted as correct but with an indication that the discrete being monitored requires further checking. Data, fault and self-test results are made available to the outside world by a serial transmitter and in parallel form by discrete output terminals. Output data is compared with data inputted for further assuring integrity of the device. Output data is selectable in either an eight bit or sixteen bit tri-state port, which is addressable for channel data, status, bounds, mismatch, built-in self-test and major fault information.