The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 1996

Filed:

May. 20, 1994
Applicant:
Inventors:

Rudolf E Slovacek, Norfolk, MA (US);

Walter F Love, Horseheads, NY (US);

Richard L Schulkind, Sharon, MA (US);

Irene M Walczak, Boston, MA (US);

Thomas A Cook, Corning, NY (US);

Assignee:

Ciba Corning Diagnostics Corp., Medfield, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
435-6 ; 356243 ; 356306 ; 356448 ; 385 12 ; 385129 ; 385130 ; 422 8205 ; 422 8208 ; 422 8211 ; 4352872 ; 4352879 ; 435808 ; 4352887 ; 436164 ; 436172 ; 436527 ; 436805 ;
Abstract

An evanescent wave system and method including an optical sensor for use in assaying a reference material and at least one molecular species or analyte in a test medium or test sample for diagnostic and other applicable purposes. The sensor includes a waveguide for propagating a radiation input along its length. The radiation input causes evanescent electromagnetic waves that are capable of stimulating output emissions that are indicative of a reference material and of one or more molecular species or analytes. By comparing the emission(s) indicative of the reference material to the emission indicative of the presence of the molecular species or analyte, the presence and concentration of the molecule in the sample can be determined. The reference material provides for normalization and/or calibration of the system.


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