The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 1996

Filed:

Mar. 07, 1995
Applicant:
Inventors:

Donald A Bradley, Morgan Hill, CA (US);

Martin I Grace, San Jose, CA (US);

Douglas R Thornton, Felton, CA (US);

David P Finch, Morgan Hill, CA (US);

Assignee:

Wiltron Company, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B / ;
U.S. Cl.
CPC ...
455 673 ; 324601 ;
Abstract

A measurement system is provided which comprises: source circuit for receiving feedback signals and for providing respective signals at respective discrete frequencies in a prescribed microwave frequency range, wherein the respective provided signals at respective discrete frequencies are substantially phase locked to at least one downconverted signal in response to the feedback signals; downconverting circuit for linearly downconverting the respective provided signals and for providing the at least one respective downconverted signal; and phase detector circuit for receiving the at least one respective downconverted signal and for providing the feedback signals.


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