The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1996
Filed:
Jun. 09, 1994
Rick Finch, Austin, TX (US);
Jeff Savage, Austin, TX (US);
Dell USA, L.P., Austin, TX (US);
Abstract
A method and apparatus for performing cache snoop testing on personal computers using software to initiate DMA cycles. The computer system includes an extended capabilities parallel port (ECP), which includes a 16 bit first-in first-out buffer (FIFO) that can be accessed in a test mode where software can manually write and read the FIFO. This FIFO in the ECP parallel port is used according to the present invention to implement cache snoop testing diagnostics on personal computers. In the preferred embodiment, various hardware subsystems such as system memory, the ECP port, and the DMA controller are tested first to ensure that, if a failure occurs during cache testing, the system can differentiate between cache snoop failures and other subsystem failures. Cache snoop testing according to the present invention uses the capability provided by the ECP parallel port to generate DMA cycles which transfer data from the ECP FIFO buffer into the system memory via software. Various algorithms can be used to perform cache snoop testing depending upon the cache architecture, i.e., write-through versus write-back and whether the cache system includes only first or both first and second level cache systems. Therefore, cache snoop testing can be performed reliably in software without the need for expensive custom test hardware.