The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1996
Filed:
Jun. 07, 1995
Applicant:
Inventors:
Kenji Yasuda, Kitamoto, JP;
Masami Yoneda, Saitama-ken, JP;
Assignee:
Fuji Photo Optical Co., Ltd., Saitame-ken, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356360 ;
Abstract
A method for interference fringe analysis in which a subject surface is located in parallel to a reference surface and multiply step shifted a specific distance for each step to derive data and images of interference fringes for determining aspects of the geometry of the subject surface.